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Dark and Illuminated Lock-In Thermography

Methodology

The lock-in thermography allows for high-resolution, noise reduced, thermographic imaging of cells and large PV module for imaging and localizing electrical defects.

Caracteristics

*Measurement under daylight possible (CLL noise reduction)
*measurement of single cells (also before metallization upto large 60 cell modules"

Expertise

*Extensive characterization of PV modules
*Durability and reliability testing"

Results

Better resolution of thermal defects related to shunt conductance in PV cells

Applications

*Analysis of hot spot, electrical shunt defects and thermal discontinuities

Localisation

Partner
InfraTEC (Germany)

Institution
CEA INES
50, avenue du Lac Léman

Contact
Eric GERRITSEN
+33 479 792 804
eric.gerritsen@cea.fr

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ref. LMPV-DLIT