Dark and Illuminated Lock-In Thermography
The lock-in thermography allows for high-resolution, noise reduced, thermographic imaging of cells and large PV module for imaging and localizing electrical defects.
*Measurement under daylight possible (CLL noise reduction)
*measurement of single cells (also before metallization upto large 60 cell modules"
*Extensive characterization of PV modules
*Durability and reliability testing"
Better resolution of thermal defects related to shunt conductance in PV cells
*Analysis of hot spot, electrical shunt defects and thermal discontinuities
50, avenue du Lac Léman
+33 479 792 804