Home > Equipments > Equipment List > Conductive AFM

Conductive AFM

Methodology

Characterisation of materials with scanning near-field optical microscope.

Scientec nano-observer AFM
Scientec nano-observer AFM

Caracteristics

* Conductive mode over 12 decades (PV, organic, thin film, etc.)
* Optical access
* 8 real-time acquisition channels

Expertise

Possibility to characterise inorganic and organic materials thanks to the soft resiscope mode.

Results

NA

References

NA

Applications

*C-AFM
* KFM
* AFM in darkness and under illumination

Localisation

Partner
OPTOPV team, Department 231

Institution
IM2NP laboratory
AMU, avenue Escadrille Normandie Niemen

Contact
D. BARAKEL
(+33) (0)4 91 28 86 13
damien.barakel@im2np.fr

Download this page in PDF
ref. IM2NP-AFM